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Life Cycle Test & Burn-In


For our equipment for the realization of life-cycle-tests and burn-ins, we combine our skills in the field of project management, testing technolgies and construction of highly reliable systems. The tempering of the devices under test plays a major role in all these systems. In some systems, we combine the temperature control unit and the electronics for driving and measuring the DUTs to compact, modular units. This concept allows both to carry out online-measurement while stressing the DUT, and the characterization of single DUTs, without having to take them out of the system. Furthermore, this space and cost-saving design cuts down the expenses for DUT handling and also prevents the mix-up of devices as a result of frequent loading and unloading.

Below we present you a small selection of our systems.

Pulsed LED Degradation and Life-Cycle-Test

Description

This system is designed to determine the degradation of LEDs. For this the LEDs are set under stress by a defined temperature (up to 125C) and a defined forward current. The forward current can either be applied continuous (up to 500mA DC) or pulsed (up to 3A). The characterization of single DUTs can be done at definable time point, without having to take the DUTs out of the system. The flexibilty of this system allows it to be used for burn-in, life testing or qualification testing.

Features and benefits

  • Stress test at DC or pulse mode
  • Stress current up to 3A
  • Pulse length from 4s to 5s
  • Duty cycle 1 to 50% (or DC)
  • Online measurement of forward voltage and emitted light
  • Device characterizations at definable time points without un- and reloading
  • Temperature range 25C to 125C. Control by TEC.
  • Stressing by cyclic temperature ramps with definable steepness up to 10K/minute.
  • Adjustable test conditions for each drawer
  • Graphical user interface
  • Device characterization
  • Remote control via TCP/IP
  • Oracle-Interface for data management on request
  • Monitoring and visualization of degradation data
photo pulsed LED degradation system
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Laser Burn-In System

Description

This station is developed for the application fields of production and quality assurance. The possible main topics are either in pre-aging the DUTs or executing life cycle tests. Both topics are realized with setting the DUTs under stress by high temperatures and high currents at definable durations and testpoints.

Features and benefits

  • Infrared, red, blue, power laser
  • Temperature 25C - 125C
  • Current range up to 10A per laser
  • Up to 120 DUTs
  • Online measurement
  • Device characterization
  • DUT managment
  • Graphical user interface, data handling
  • Monitoring and visualization of degradation data
photo laser burnin system
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LED Burn-In System

Description

The main item of this system is to simulate and measure aging processes under defined conditions. These adjustable conditions are current, temperature and load duration. The duration can be up to several thousand hours. All the DUTs are measured online without un- and reloading.

Features and benefits

  • Online measurement
  • Temperature control by TEC
  • Adjustable test conditions for each drawer (set of 30)
  • Graphical user interface
  • Device characterization
  • Remote control via TCP/IP
  • Oracle-Interface for data management
  • Device characterizations
  • Monitoring and visualization of degradation data
  • Up to 900 DUTs
photo LED burnin system
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Burnin of Laser in TO-package

Description

The tempering of laser diodes, that have already been mounted in TO-packages is complex. Using small, compact units, combining the temperature chamber and driver electronics, we are able to build a modular system for the testing of several hundreds of laser diodes. Each unit can be equipped with a horde of several (e.g. 40) DUTs.
Since an integrated measuring system would be very complex and costly, we are offering an additional semi-automated test station, which can handle the DUT hordes. The hordes are marked by a RFID to avoid a mix-up of the DUTs.


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Thermal stressing of chip-cards

Description

System to prove the stability of contacts under wide variations of the temperature in a range of -40 C to 125 C. Using peltier elements, temperature profiles cab be driven. The status of each contact can be measured online at any time. In contrast to conventional systems using two separate climate chambers, this system is able to monitor the behavior of the DUTs during the transition of temperature.

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